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Surface topography and light scattering were measured on 15 samples ranging from those having smooth surfaces to others with ground surfaces. The measurement techniques included an atomic force microscope, mechanical and optical profilers, confocal laser scanning microscope, angle-resolved scattering, and total scattering. The samples included polished and ground fused silica, silicon carbide, sapphire, electroplated gold, and diamond-turned brass. The measurement instruments and techniques had different surface spatial wavelength band limits, so the measured roughnesses were not directly comparable. Two-dimensional power spectral density (PSD) functions were calculated from the digitized measurement data, and we obtained rms roughnesses by integrating areas under the PSD curves between fixed upper and lower band limits. In this way, roughnesses measured with different instruments and techniques could be directly compared. Although smaller differences between measurement techniques remained in the calculated roughnesses, these could be explained mostly by surface topographical features such as isolated particles that affected the instruments in different ways.

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J. M. Bennett (jbennett@ridgenet.net) is with the Physics Division, Naval Air Warfare Center, China Lake, California 93555.

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R. D. Jacobson, S. R. Wilson, G. A. Al-Jumaily, J. R. McNeil, Jean M. Bennett, and Lars Mattsson Appl. Opt. 31(10) 1426-1435 (1992)

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When this research was performed, A. Duparré (duparre@iof.fhg.de), J. Ferre-Borrull, S. Gliech, G. Notni, and J. Steinert were with the Optical Systems Department, Fraunhofer Institute for Applied Optics and Precision Engineering, Schillerstrasse 1, D-07745 Jena, Germany.

To calculate displacement when initial velocity, acceleration, and time values are specified, use the formula S = ut + 1/2at². In this formula, U represents the initial velocity, A is the object’s acceleration, and T can equal the total time or the amount of time that the object accelerated for. Plug the provided values into the formula, and solve the formula for S according to the order of operations. Your answer will be the displacement measured in meters, feet, inches, or other units of length. If you want to learn how to calculate angular displacement, keep reading the article! Did this summary help you?YesNo

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Average rms Roughnesses (nm) Calculated from PSDs for Bands A and B and rms Roughnesses (nm) Calculated from TS measurements

Gyanendra S. Lodha, Koujun Yamashita, Hideyo Kunieda, Yuzuru Tawara, Jin Yu, Yoshiharu Namba, and Jean M. Bennett Appl. Opt. 37(22) 5239-5252 (1998)

Vision Forum is a major advocate of Biblical Patriarchy. This ideology includes the belief that there are God ordained distinct gender roles and that man was ...

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Displacement in physics refers to on object's change in position. When you calculate displacement, you measure how "out of place" on object is based on its initial location and its final location. The formula you use for calculating displacement will depend on variables that are provided to you in a given problem. Follow these steps to calculate displacement.

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While a wide variety of lenses are available, they are broadly grouped by focal length and F-stop. Lenses with short focal lengths will have a wide angle of ...

Surface Spatial Frequency and Surface Spatial Wavelength Ranges for the Raw Measurements (the Theoretical Ranges of the Instruments are Larger) and for the PSD Curves for all Measuring Instruments

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Surface topography and light scattering were measured on 15 samples ranging from those having smooth surfaces to others with ground surfaces. The measurement techniques included an atomic force microscope, mechanical and optical profilers, confocal laser scanning microscope, angle-resolved scattering, and total scattering. The samples included polished and ground fused silica, silicon carbide, sapphire, electroplated gold, and diamond-turned brass. The measurement instruments and techniques had different surface spatial wavelength band limits, so the measured roughnesses were not directly comparable. Two-dimensional power spectral density (PSD) functions were calculated from the digitized measurement data, and we obtained rms roughnesses by integrating areas under the PSD curves between fixed upper and lower band limits. In this way, roughnesses measured with different instruments and techniques could be directly compared. Although smaller differences between measurement techniques remained in the calculated roughnesses, these could be explained mostly by surface topographical features such as isolated particles that affected the instruments in different ways.

J. Ferre-Borrull is now with the Applied Physics and Optics Department, University of Barcelona, Diagonal 647, E-08028 Barcelona, Spain.

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PTZOptics Producer SE Bundle [PT20XSE-PRODUCER-JOY4] - Cameras: The PTZOptics Producer SE Bundle Includes the Following: (3) PTZOptics Move SE 20X (Gray) ...

This article was reviewed by Grace Imson, MA. Grace Imson is a math teacher with over 40 years of teaching experience. Grace is currently a math instructor at the City College of San Francisco and was previously in the Math Department at Saint Louis University. She has taught math at the elementary, middle, high school, and college levels. She has an MA in Education, specializing in Administration and Supervision from Saint Louis University. There are 9 references cited in this article, which can be found at the bottom of the page. This article has been fact-checked, ensuring the accuracy of any cited facts and confirming the authority of its sources. This article has been viewed 516,493 times.

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