Lee, Jimin, Sang-Hwan Kim, Hyeunwoo Kwen, Juneyoung Jang, Seunghyuk Chang, JongHo Park, Sang-Jin Lee, and Jang-Kyoo Shin. 2020. "CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity" Sensors 20, no. 18: 5138. https://doi.org/10.3390/s20185138

Lee J, Kim S-H, Kwen H, Jang J, Chang S, Park J, Lee S-J, Shin J-K. CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity. Sensors. 2020; 20(18):5138. https://doi.org/10.3390/s20185138

BSI CMOS

High-intensity discharge lamps offer an energy-efficient way to brightly illuminate large spaces - for instance street lighting, sports stadiums, indoor arenas and cinemas. They can also be used for indoor horticulture and aquariums, and are even seen lighting residential and retail spaces. HID lamps work by sending an electrical discharge between two electrodes and through a plasma (ionised gas). The current is regulated by a ballast. As well as producing excellent brightness for very little energy, they are very long-lasting, especially the high-pressure sodium varieties.

Abstract: This paper presents a CMOS depth image sensor with offset pixel aperture (OPA) using a back-side illumination structure to improve disparity. The OPA method is an efficient way to obtain depth information with a single image sensor without additional external factors. Two types of apertures (i.e., left-OPA (LOPA) and right-OPA (ROPA)) are applied to pixels. The depth information is obtained from the disparity caused by the phase difference between the LOPA and ROPA images. In a CMOS depth image sensor with OPA, disparity is important information. Improving disparity is an easy way of improving the performance of the CMOS depth image sensor with OPA. Disparity is affected by pixel height. Therefore, this paper compared two CMOS depth image sensors with OPA using front-side illumination (FSI) and back-side illumination (BSI) structures. As FSI and BSI chips are fabricated via different processes, two similar chips were used for measurement by calculating the ratio of the OPA offset to pixel size. Both chips were evaluated for chief ray angle (CRA) and disparity in the same measurement environment. Experimental results were then compared and analyzed for the two CMOS depth image sensors with OPA. Keywords: offset pixel aperture; CMOS depth image sensor; back-side illumination structure; improving disparity

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Lee J, Kim S-H, Kwen H, Jang J, Chang S, Park J, Lee S-J, Shin J-K. CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity. Sensors. 2020; 20(18):5138. https://doi.org/10.3390/s20185138

Lee, J.; Kim, S.-H.; Kwen, H.; Jang, J.; Chang, S.; Park, J.; Lee, S.-J.; Shin, J.-K. CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity. Sensors 2020, 20, 5138. https://doi.org/10.3390/s20185138

Editor’s Choice articles are based on recommendations by the scientific editors of MDPI journals from around the world. Editors select a small number of articles recently published in the journal that they believe will be particularly interesting to readers, or important in the respective research area. The aim is to provide a snapshot of some of the most exciting work published in the various research areas of the journal.

Back sideilluminated

Lee, J., Kim, S. -H., Kwen, H., Jang, J., Chang, S., Park, J., Lee, S. -J., & Shin, J. -K. (2020). CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity. Sensors, 20(18), 5138. https://doi.org/10.3390/s20185138

Lee, J.; Kim, S.-H.; Kwen, H.; Jang, J.; Chang, S.; Park, J.; Lee, S.-J.; Shin, J.-K. CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity. Sensors 2020, 20, 5138. https://doi.org/10.3390/s20185138

Optical format

Lee, J., Kim, S. -H., Kwen, H., Jang, J., Chang, S., Park, J., Lee, S. -J., & Shin, J. -K. (2020). CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity. Sensors, 20(18), 5138. https://doi.org/10.3390/s20185138

Feature papers represent the most advanced research with significant potential for high impact in the field. A Feature Paper should be a substantial original Article that involves several techniques or approaches, provides an outlook for future research directions and describes possible research applications.

Feature papers are submitted upon individual invitation or recommendation by the scientific editors and must receive positive feedback from the reviewers.

Lee, Jimin, Sang-Hwan Kim, Hyeunwoo Kwen, Juneyoung Jang, Seunghyuk Chang, JongHo Park, Sang-Jin Lee, and Jang-Kyoo Shin. 2020. "CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity" Sensors 20, no. 18: 5138. https://doi.org/10.3390/s20185138