Indicates the ratio of the material length Ml(c) of the profile element to the evaluation length for the section height level c (% or μm).

This parameter expands the profile (line roughness) parameter Rdq three dimensionally. It indicates the mean magnitude of the local gradient (slope) of the surface. The surface is more steeply inclined as the value of the parameter Sdq becomes larger.

Note This parameter relates to the tip geometry of peaks and valleys and is suitable for analyzing the degree of contact between two objects.

Rk  Core roughness depth Rpk  Reduced peak height Rvk  Reduced valley depth Mr1, Mr2  Material portion

The MVCam SWIR Camera’s Camera Link™ interface ensures compatibility with a wide range of microscopy systems, allowing for seamless integration. The flexible data output options accommodate different frame rates and resolutions, catering to various application needs. To maximize the benefits of SWIR imaging, it is essential to optimize camera settings and integrate the SWIR camera effectively into your microscopy system.

LWIR

The MVCam SWIR camera represents the latest advancements in SWIR imaging technology, specifically designed to enhance microscopy applications. Key features of the MVCam include high resolution (1280x1024 megapixels), fast frame rate (up to 90 frames per second), InGaAs sensor technology with a 12µm pixel pitch, 0.4-1.7µm wavelength range covering both visible and SWIR for versatile imaging. The MVCam also has an integrated single-stage thermoelectric cooler for consistent sensor temperature, minimizing thermal noise and medium and base Camera Link™ configurations for flexible data output and system integration.

This parameter expands the profile (line roughness) parameter Rku three dimensionally; Rku, is used to evaluate sharpness in the height distribution.

This is the number of peaks per unit area. Only peaks that exceed a designated size are counted. Unless otherwise specified, the designated size is determined to be 5% of the maximum height Sz.

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SWIR imaging with the MVCam can significantly advance biological research by providing deeper insights into cellular and tissue structures by observing cellular processes and structures with enhanced contrast and detail. The MVCam is also able to visualize internal tissue structures in tissue analysis and study tissue morphology with improved penetration and reduced scattering.

Rku=3: Normal distribution Rku>3: The height distribution is sharp Rku<3: The height distribution is even

Note Rt is a stricter standard than Rz in that the measurement is conducted against the evaluation length. It should be noted that the parameter is significantly influenced by scratches, contamination, and measurement noise due to its utilization of peak values.

The advantages of SWIR in microscopy include enhanced contrast and detail, improved penetration and reduced scatter and noise. SWIR imaging provides superior contrast and detail for distinguishing between materials and structures that are difficult to differentiate using visible light. SWIR light can penetrate deeper into biological tissues and materials, allowing for imaging of internal structures that are opaque to visible light. SWIR wavelengths are less scattered by particles and imperfections, leading to clearer images in challenging conditions.

Note Rzjis is equivalent to the parameter Rz of the obsolete JIS standard B0601:1994. Although ten-point mean roughness was deleted from current ISO standards, it was popularly used in Japan and was retained within the JIS standard as the parameter Rzjis.

In material science, the MVCam SWIR cameras offer valuable advantages for analyzing materials and detecting defects. In material characterization, the MVCam can examine material surfaces and internal structures with high resolution, revealing hidden defects and characteristics. The MVCam can also assist with quality control by monitoring and inspecting materials in real-time, ensuring consistent quality and performance.

Note This parameter is used to evaluate the horizontal size of parallel grooves and grains instead of the height parameters.

SonySWIR

The horizontal distance of the autocorrelation function that has the fastest decay to a specified value s (0≤ s < 1). Unless otherwise specified, the parameter is specified as = 0.2.

Rsk=0: Symmetric against the mean line (normal distribution) Rsk>0: Deviation beneath the mean line Rsk<0: Deviation above the mean line

Minimum height discrimination: 10% of the Rz value Minimum length discrimination: 1% of the reference length

Pdc  The section height level difference for the primary profile Wdc   The section height level difference for the waviness profile

Rk, Mr1, and Mr2 values are calculated from the linear curve (equivalent linear curve) minimizing the sectional inclination corresponding to 40% of the material ratio curve. Draw a triangle with the area equivalent to the protrusion of the material ratio curve segmented by the breadth of the parameter Rk and calculate parameters Rpk and Rvk.

This parameter is defined as the ratio of the horizontal distance of the autocorrelation function that has the fastest decay to a specified value s to the horizontal distance of the autocorrelation function that has the slowest decay to s (0 ≤ s < 1) and indicates the isotropic/anisotropic strength of the surface.

This signifies the rate of an increase in the surface area. The increase rate is calculated from the surface area A1 derived by the projected area A0.

GigE Vision is a global camera interface standard developed using the Gigabit Ethernet communication protocol.

The average value of the heights of the five peaks with the largest global peak height added to the average value of the heights of the five pits with the largest global pit height.

Mid infrared

Material ratio curves signify the ratio of materiality derived as a mathematical function of parameter c, where c represents the height of severance for a specific sample. This is also referred to as the bearing curve (BAC) or Abbott curve. Probability density curves signify the probability of occurrence for height Zx. The parameter is equivalent to the height distribution histogram.

This parameter expands the profile (line roughness) parameter Rv three dimensionally. It is the maximum value for the valley’s depth.

SWIRVision Systems

Minimum height discrimination: 10% of the Rz value Minimum length discrimination: 1% of the reference length

Microscopy is a fundamental tool in scientific research, allowing scientists to observe and analyze the minutiae of biological specimens, materials, and devices. While visible light microscopy provides valuable insights, the integration of shortwave infrared (SWIR) cameras introduces a new dimension to imaging. SWIR technology, particularly through Princeton Infrared Technologies' MVCam SWIR camera, enhances microscopy capabilities and addresses the limitations of conventional imaging methods.

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NIRSWIR

Note Std represents the angle for the strongest orientation, although the second and third strongest angles can also be defined on the directional chart.

Note This is one of the most widely used parameters and is also referred to as the RMS value. The parameter Rq corresponds to the standard deviation of the height distribution. The parameter generates good statistics and enables stable results since the parameter is not significantly influenced by scratches, contamination, and measurement noise.

Motif parameters are used for the evaluation of surface contact status based on the enveloped features of the sample surface.

Sku=3: Normal distribution Sku>3: Height distribution is sharp Sku<3: Height distribution is even

Note One of the most widely used parameters is the mean of the average height difference for the average surface. It provides for stable results as the parameter is not significantly influenced by scratches, contamination, and measurement noise.

Shortwave infrared (SWIR) imaging captures light in the wavelength range of approximately 0.4 to 1.7 µm. Unlike visible light, SWIR can penetrate deeper into materials and tissues, providing unique contrasts and details that are not visible with traditional visible light microscopy.

Note This parameter concerns the height distribution and is suitable for evaluating the abrasion and oil sump of lubricants for slide planes.

This parameter expands the material ratio curve parameters (Rk, Rpk, Rvk, Mr1, and Mr2) of the profile parameter three dimensionally.

AR  Mean spacing of roughness motifs: the arithmetic mean of roughness motifs ARi calculated from the evaluation length R  Mean depth of roughness motifs: the arithmetic mean of the roughness motif depth Hj calculated from the evaluation length Rx  Maximum depth of roughness motifs: the maximum value of the Hj calculated from the evaluation length AW  Mean spacing of waviness motifs: the arithmetic mean of the waviness motif AWi calculated from the evaluation length W  Mean depth of waviness motifs: the arithmetic mean of the waviness motif depth HWj calculated from the evaluation length Wx  Maximum depth of waviness motifs: the maximum value of the HWj calculated from the evaluation length

The integration of SWIR cameras, such as the Princeton Infrared Technologies MVCam SWIR camera, represents a significant advancement in microscopy. By extending imaging capabilities beyond the visible spectrum, SWIR technology provides enhanced contrast, detail, and penetration, opening new possibilities for research and analysis across various fields.

Spc indicates the mean principle curvature (average sharpness) of the peaks. Only peaks that exceed a designated curvature are taken into consideration.

This parameter expands the profile (line roughness) parameter Rz three dimensionally. The maximum height Sz is equivalent to the sum of the maximum peak height Sp and maximum valley depth Sv.

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Note This is one of the most widely used parameters and is the mean of the average height difference for the average plane. It provides stable results since the parameter is not significantly influenced by scratches, contamination, and measurement noise.

Note These parameters are used to evaluate the horizontal size and complexity of parallel grooves and grains instead of the height parameters.

The material volume and void volume are calculated from a material ratio curve as indicated in the diagram. The position that corresponds to a material ratio of 10% and 80% is regarded as the threshold segmenting the peak, core, and dale.

Represents the sum of the maximum peak height Zp and the maximum valley depth Zv of a profile within the reference length.

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Note Although frequently used, max height is significantly influenced by scratches, contamination, and measurement noise due to its reliance on peak values.

Pmr  The relative material length rate of the primary profile Wmr  The relative material length rate of the waviness profile

Note This is one of the most widely used parameters and is also referred to as the RMS value. The parameter Rq ７corresponds to the standard deviation of the height distribution. The parameter provides for easy statistical handling and enables stable results as the parameter is not significantly influenced by scratches, contamination, and measurement noise.

Note Although frequently used, this parameter is significantly influenced by scratches, contamination, and measurement noise due to its utilization of peak values.

Note This parameter is suitable for evaluating friction and abrasion. It is also used to evaluate lubricity for engine cylinder surfaces.

This parameter expands the profile (line roughness) parameter Rsk three dimensionally; parameter Rsk, is used to evaluate deviations in the height distribution.

This parameter indicates the direction angle of the texture (parallel groove orientation, etc.). It is derived from the angle maximizing the angle spectrum of two-dimensional Fourier transformation images.

Pt  The maximum total height of the profile (Rmax in the case of JIS’82) Wt  The maximum total height of the waviness

Note This parameter relates to the tip geometry of peaks and valleys and is suited to analyzing the contact between two objects.

Pmr (c)  The material length rate of the primary profile (formerly tp) Wmr (c)  The material length rate of the waviness

Swirmwir lwir

Note These parameters are suited to evaluating the slippage of lubrication mechanisms and contact surfaces, such as gaskets.

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Note This function is used to evaluate friction and abrasion. It is also used to evaluate the lubricity of engine cylinder surfaces.

Sk  Core height: the difference between the upper and lower levels of the core Spk  Reduced peak height: the mean height of the protruding peaks above the core Svk  Reduced valley height: the mean height of the protruding dales beneath the core Smr1  The areal material ratio segmenting protruding peaks from the core (indicated as a percentage) Smr2  Areal material ratio segmenting protruding valleys from the core (indicated as percentage)

Ssk=0: Symmetric against the mean line Ssk>0: Deviation beneath the mean line Ssk<0: Deviation above the mean line

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Represents the sum of the mean value for the height of the five tallest peaks and the mean of the depth of the five deepest valleys of a profile within the sampling length.

This parameter expands the profile (line roughness) parameter Rp three dimensionally. It is the maximum value for peak height.

The parameter is calculated from the number of peaks divided by the projected area. Arithmetic mean peak curvature (Spc). Spc indicates the mean principle ...

The Str value ranges from 0 to 1; normally Str > 0.5 indicates a strong isotropy while Str < 0.3 is strongly anisotropic.

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Rmr indicates the material ratio determined by the difference Rδc between the referential section height level C0 and the profile section height level.

Note This parameter concerns height distribution. It is suitable for evaluating the abrasion and oil sump of lubricants for slide planes.

Represents the sum of the maximum peak height Zp and the maximum valley depth Zv of a profile within the evaluation length, not sampling length.

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The difference in height between the p and q material ratio. Unless specified otherwise, the values p=2.5%, q=50% shall be applied.