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J. M. Bennett (jbennett@ridgenet.net) is with the Physics Division, Naval Air Warfare Center, China Lake, California 93555.

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When this research was performed, A. Duparré (duparre@iof.fhg.de), J. Ferre-Borrull, S. Gliech, G. Notni, and J. Steinert were with the Optical Systems Department, Fraunhofer Institute for Applied Optics and Precision Engineering, Schillerstrasse 1, D-07745 Jena, Germany.

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Features: High quality professional optical glass lenses Works with eyepieceless stereo 3D microscope Specifications: Model: AJ5L10 Magnification: 10X ...

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The typical image resolution in the OCT system is greater than other imaging techniques, including ultrasound, magnetic resonance imaging, and computed axial ...

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The compound microscope is a useful tool for magnifying objects up to as much as 1000 times their normal size. Using the microscope takes lots of practice. Follow the procedures below both to get the best results and to avoid damaging the equipment.

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The depth of focus is greatest on the lowest power objective. Each time you switch to a higher power, the depth of focus is reduced. Therefore a smaller part of the specimen is in focus at higher power. Again, this makes it easier to find an object on low power, and then switch to higher power after it is in focus. A common exercise to demonstrate depth of focus involves laying three different colored threads one on top of the other. As the observer focuses down, first the top thread comes into focus, then the middle one, and finally the bottom one. On higer power objectives one may go out of focus as another comes into focus.

R. D. Jacobson, S. R. Wilson, G. A. Al-Jumaily, J. R. McNeil, Jean M. Bennett, and Lars Mattsson Appl. Opt. 31(10) 1426-1435 (1992)

Root mean square roughnesspdf

Surface topography and light scattering were measured on 15 samples ranging from those having smooth surfaces to others with ground surfaces. The measurement techniques included an atomic force microscope, mechanical and optical profilers, confocal laser scanning microscope, angle-resolved scattering, and total scattering. The samples included polished and ground fused silica, silicon carbide, sapphire, electroplated gold, and diamond-turned brass. The measurement instruments and techniques had different surface spatial wavelength band limits, so the measured roughnesses were not directly comparable. Two-dimensional power spectral density (PSD) functions were calculated from the digitized measurement data, and we obtained rms roughnesses by integrating areas under the PSD curves between fixed upper and lower band limits. In this way, roughnesses measured with different instruments and techniques could be directly compared. Although smaller differences between measurement techniques remained in the calculated roughnesses, these could be explained mostly by surface topographical features such as isolated particles that affected the instruments in different ways.

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Root mean square roughnessformula

When drawing what you see under the microscope, follow the format shown below. It is important to include a figure label and a subject title above the image. The species name (and common name if there is one) and the magnification at which you were viewing the object should be written below the image. All relevant parts of the drawing should be labelled on the right side of the image using straight lines. Lines should not cross. Drawings should be done in pencil, while labels should be in pen or typed. Remember that total magnification is determined by multiplying the ocular x objective.

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution. Contact your librarian or system administrator or Login to access Optica Member Subscription

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution. Contact your librarian or system administrator or Login to access Optica Member Subscription

Oct 3, 2011 — With my second focal plane scopes, I bring the reticule into focus by screwing in or out the rearmost lens until the crosshairs/reticule are in ...

Root mean square roughnesscalculator

Surface Spatial Frequency and Surface Spatial Wavelength Ranges for the Raw Measurements (the Theoretical Ranges of the Instruments are Larger) and for the PSD Curves for all Measuring Instruments

The field of view is largest on the lowest power objective. When you switch to a higher power, the field of view closes in towards the center. You will see more of an object on low power. Therefore, it is best to find an object on low power, center it, and then switch to the next higher power and repeat.

*** Don't hoard slides! You can only view one at a time, so that's all you should be holding. Return it before getting another, and if you break it, tell your instructor so that it can be properly cleaned up and replaced! ***

Gyanendra S. Lodha, Koujun Yamashita, Hideyo Kunieda, Yuzuru Tawara, Jin Yu, Yoshiharu Namba, and Jean M. Bennett Appl. Opt. 37(22) 5239-5252 (1998)

J. Ferre-Borrull is now with the Applied Physics and Optics Department, University of Barcelona, Diagonal 647, E-08028 Barcelona, Spain.

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Average rms Roughnesses (nm) Calculated from PSDs for Bands A and B and rms Roughnesses (nm) Calculated from TS measurements

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Download scientific diagram | Spatial resolution in line pairs per millimeter (LP/mm) for an x-ray source of 6 mm focal spot size as affected by geometrical ...