CCDcamera

Extended scanning is particularly useful when:• Identifying similar materials such as polymers or pharmaceutical polymorphs. For reliable identification, extended Raman spectra should contain the Raman bands in the fingerprint region (<1500 cm-1). Raman spectra should also include the CH2 and CH3 stretching modes (between 2800 cm-1 and 3300 cm-1).• Resolving both broad and sharp features in the PL spectra from semiconductor materials like SiC. Scientists use PL spectra to study the electronic properties and the presence of defects in semiconductors. This often requires a spectral range of hundreds of nanometers (or thousands of wavenumbers, cm-1). For an inVia™ confocal Raman microscope with a 532 nm laser, SynchroScan technology can cover a spectral range of up to 10,000 cm-1 in a single extended scan.

Radius of curvature (R1 in mm). Index of refraction of the surrounding medium (n0):, Radius of Curvature (R2 in mm). Focal Length (in mm):. Thin Lens Equation ...

SynchroScan technology uses a patented method to synchronise the stepwise rotation of the diffraction grating with continuous readout at the detector. As the diffraction grating rotates, the light on the detector moves in the direction of linear dispersion. To keep in step with this movement, the signal also moves along to the next pixel. When the accumulated signal gets to the edge of the Centrus detector, the software records the next point on the spectrum. For further details see C. Dyer & B.J.E. Smith, Journal of Raman Spectroscopy, Vol. 26, 777-783 (1995).

Older drawings may use roughness grade numbers according to DIN ISO 1302. This standard divides the surface roughness into twelve grades. Each class from N1 to N2 represents a maximum permissible Ra value according to this standard.

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Both Ra and Rz are typically measured using profilometers. These devices can be contact-based, where a stylus physically traces the surface, or non-contact, using optical or laser methods. Non-contact methods are preferred for delicate or high-precision surfaces as they avoid physical interference with the surface being measured.

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3.2 μm Ra is usually the standard surface finishing for machined parts. It is suitable for most consumer parts and sufficiently smooth, but it contains visible cut marks. It is the default surface roughness applied at Xometry unless otherwise specified. Smoother surfaces that are also usually achievable with CNC machining and offered by Xometry are 1.6 μm Ra, 0.8 μm Ra and 0.4 μm Ra.

Mid-to slow evaporating solvent. Has 100% water solubility and is ideally suited as a coupling agent in a wide range of solvent systems.

While less common in modern practices, Rz (mean roughness depth) can be still found, especially in older technical drawings. This makes Rz particularly valuable for applications where extreme height variations impact performance, such as in sealing surfaces or components involved in sliding contacts.

CCDdetector Telescope

When we equip a high throughput inVia™ confocal Raman microscope with the Centrus detector, it is capable of the most challenging spectroscopic measurements. The Centrus detector is a thermoelectrically cooled charge-coupled device (CCD) detector. It has a high quantum efficiency and ultra-low readout noise to detect even the weakest Raman bands.

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For coloured samples with high fluorescence backgrounds in the visible range, Raman spectroscopy using an excitation laser at 1064 nm can help to reveal Raman bands. Choose an inVia microscope with an InGaAs detector for Raman spectroscopy at longer infrared wavelengths.

CCDdetector spectroscopy

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Broadband spectrum of SiC showing photoluminescence (PL) features. The spectral range is from 400 nm to beyond 1000 nm. This spectral range is over 10,000 cm-1, from the visible blue wavelengths to beyond the infrared. Data courtesy of Prof. John Steeds and Dr. Geraint Evans, Dept of Physics, University of Bristol, UK.

Charge-coupled device

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Ra is the numerical average of the absolute values of the deviations of all the peaks and valleys from the mean line within the measurement length. It is also called the Center Line Average (CLA).

CCDarray detector

Centrus detectors support SynchroScan™ extended scanning technology. With SynchroScan technology, you can easily collect artefact-free continuous spectra over a broad spectral range. SynchroScan technology does not compromise on high spectral resolution. You do not have to use a diffraction grating with lower dispersion to extend the spectral range.

Ra (average roughness) is the predominant parameter for measuring surface roughness due to its ease of use and broad applicability. This simplicity makes it ideal for various applications, such as ensuring the smoothness of automotive parts, medical devices, and optical components​.

If required, we can configure an inVia microscope with up to 4 different detectors. This includes back-illuminated (BI) or electron-multiplying (EM) CCD detectors. Get in touch to find out if these options are suitable for your sample type.

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With the Centrus detector, you can take advantage of Renishaw's ultra-fast Raman imaging techniques. You can also run rapid time-series measurements to analyse chemical reactions. Using Renishaw's patented electronic designs, the Centrus detector can achieve a high-speed readout rate of 2 MHz. This enables the collection of full-range, high-resolution spectra at rates faster than 1800 spectra per second.

With a single Centrus detector, you can collect high-quality Raman and PL spectra with laser excitations ranging from 229 nm to 830 nm. Our CCD detector has a high detection efficiency across a broad range of wavelengths, from the deep-ultraviolet (DUV) to the near-infrared (NIR). In combination with the inVia microscope's full automation and kinematically-mounted spectrometer optics, you can easily use a wide spectral range.