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With line scan cameras, the object must be moving under the camera or the camera moving over the object to build up a 2D image. The resulting image can then be treated and processed the same as an area scan camera image.

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The thickness of the anti-reflection coating is chosen so that the wavelength in the dielectric material is one quarter the wavelength of the incoming wave. For a quarter wavelength anti-reflection coating of a transparent material with a refractive index n1 and light incident on the coating with a free-space wavelength λ0, the thickness d1 which causes minimum reflection is calculated by:

For the reflectance at normal incidence we define a series of parameters: r1, r2, and θ. The surrounding region has a refractive index of n0, the ARC has a refractive index of n1 and a thickness of t1, and the silicon has a refractive index of n2.

This video describes how line scan works and the consideration that must be given to the trigger interface to ensure image data integrity.

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A line scan camera is capable of creating very high resolution images at very high speeds- without breaking the bank! Even when speed is not the issue, this technology overcomes the difficulties and cost associated with area scan solutions of very high resolution. Lighting is one key factor, where area scan solutions require large uniform lights, a line scan solution requires a uniform thin line of light. Line scan is a perfect solution for processes and productions that are constantly moving, that require high speed and/or high resolution imaging.

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Bare silicon has a high surface reflection of over 30%. The reflection is reduced by texturing and by applying anti-reflection coatings (ARC) to the surface1. Anti-reflection coatings on solar cells are similar to those used on other optical equipment such as camera lenses. They consist of a thin layer of dielectric material, with a specially chosen thickness so that interference effects in the coating cause the wave reflected from the anti-reflection coating top surface to be out of phase with the wave reflected from the semiconductor surfaces. These out-of-phase reflected waves destructively interfere with one another, resulting in zero net reflected energy. In addition to anti-reflection coatings, interference effects are also commonly encountered when a thin layer of oil on water produces rainbow-like bands of color.

While the reflection for a given thickness, index of refraction, and wavelength can be reduced to zero using the equations above, the index of refraction is dependent on wavelength and so zero reflection occurs only at a single wavelength. For photovoltaic applications, the refractive index, and thickness are chosen in order to minimize reflection for a wavelength of 0.6 µm. This wavelength is chosen since it is close to the peak power of the solar spectrum.

The cross-web resolution (X) is determined by the number of pixels the camera has, in this example if the camera has 1000 pixels and the cross-web FOV is 100mm, the X resolution in the real-world would be 0.1mm.

Our line scan Technology Specialists are here to discuss your application and answer questions you may have about this powerful imaging technique.

For example, in the measurement sequence "49-21-140" the number 49 represents a lens width of 49 millimeters. Larger numbers mean bigger and wider lenses, while ...

HIKrobot MV-CL line scan cameras using latest GPixel CMOS sensors are available in 2k, 4k and 8k resolution with up to 100Khz line rate, mono/bayer-colour and feature rich.

This technology is used very successfully in many applications, ranging from glue sealant bead inspection to food sorting. This model of camera is used when area scan imaging is not appropriate or is too expensive per pixel in comparison to line scan imaging. Cameras are available for monochrome, colour and even SWIR applications, and are all available from Multipix Imaging. We have been supplying line scan technology since 1997 and have a wealth of experience to share with you.

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Unlike CCD sensors (Charge-Coupled Device), CMOS sensors (Complementary Metal-Oxide Semiconductor) convert charge into voltage straight in the pixels. Voltage ...

Watch the excellent video on the left from our partner, Euresys. Multipix Imaging are proud to represent Euresys in the UK and Ireland for Frame grabber technology and their Image Processing Library Open eVision software.

The graph shows the effect of a single layer anti-reflection coating on silicon. Use the sliders to adjust the refractive index and thickness of the layer. For simplicity this simulation assumes a constant refractive index for silicon at 3.5. In reality the refractive index of silicon and the coating is a function of wavelength.

It is almost always preferred that square pixels (real-world resolution) are the result of a line scan image. This means if a circular object is passed under the camera, the result is an image which has a circular object (Fig.5a). If the scan rate of the camera is too fast or too slow, the resulting image would show either an elongated circle (Fig.5b) or a squashed circle (Fig.5c).

Reflection is further minimized if the refractive index of the anti-reflection coating is the geometric mean of that of the materials on either side; that is, glass or air and the semiconductor. This is expressed by: