Microscope Koehler Illumination, How to Set It Up Properly - koehler illumination
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So, what I’m trying to find is something that can screw into the L bracket, which is on battery (built-in or taking loose AA/AAA) with a flexible neck that reach around the diffuser and act as a help while focusing.
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I’m trying to put together a dedicated macro setup. The plan is to get a cygnustech diffuser for a Godox V350 on my Canon RP (the lens is still un-decided, most likely candidates are Laowa 90mm and Canon EF 100L).
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Surface roughness can tell a lot about the material something is made from and its past processing history. If the surface roughness for a part needs to be taken but making physical contact with the surface is not advised (to avoid surface damage or altering a feature of interest) than white light interferometry is a great solution. The basic principle of interferometry is that light is reflected from a reference mirror and combined with light reflected from the sample surface to produce interference fringes, where the best contrast fringe occurs at the best focus. Ebatco possesses a Wyko NT3300 white light interferometer manufactured by Veeco. The NT3300 has two measurement modes, phase shift interferometry (PSI) and vertical scanning interferometry (VSI). PSI mode uses variations in phase of a monochromatic reference light compared to light reflected off of the sample to calculate small height variations on the sample surface. This measurement mode is useful for surfaces with step-heights of less than a quarter of the wavelength used and provides sub-nanometer vertical resolution. VSI mode uses a multi-wavelength white light source to measure the degree of fringe modulation, or coherence, between the reference and sample beams. As the beam is moved vertically through the sample focus, the maximum fringe contrast is extracted at each point on the sample surface, and forms a topographical map. This mode of measurement can be used to measure features up to 2 mm in height.
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In addition to surface roughness analysis, The Wyko NT3300 optical profilometer can also be used to acquire contour and morphology of parts in three-dimensions. Once the data is acquired, critical dimensions such as distance, depth, thickness, and other geometrical parameters can be obtained. These capabilities have found usefulness in characterizing thin films and coatings for thickness measurement through step height determination across coated and uncoated areas.
But to make things easier I’m looking for a focus light and can’t seem to find the right thing. I’m using a 3-Legged Thing Lexie L bracket, so there’s two free 1/4"-20 screw holes available on side of the camera.