Several Step Scan options are available for the FT/IR-8X; these include µsec and nsec Time-Resolved Spectroscopy (TRS), phase modulation, and amplitude modulation.

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The X-Series of FTIR spectrometers takes advantage of many useful software applications in the intuitive Spectra Manager™ Suite with integrated search software solution, KnowItAll® Informatics, and database.

The ATR PRO 4X is a single-reflection monolithic diamond ATR accessory with a 45° incident angle specifically designed for the FT/IR-4X sample compartment.

The ATR PRO X VIEW is a single-reflection monolithic diamond ATR accessory with a 45° incident angle that can be placed in the sample compartment of the FT/IR-4X, FT/IR-6X, or FT/IR-8X. The ATR PRO X VIEW has a camera and LCD monitor for real-time sample observation. The observed image and spectrum data are saved together in a single file.

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The FT/lR-6X with 28 degree Michelson interferometer is an excellent choice for more demanding research applications, where better polarization performance or a more flexible approach to samples and measurement are required.

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For laboratories that operate under the requirement of regulatory compliance,  instrument validation routine  standard for verification of instrument performance compliant with ASTM, EP, and JP procedures. Spectra Manager CFR is compliant to the latest requirements of ALCOA+

Rapid Scan is an option on the FT/IR-4X (80 Hz) and FT/IR-6X (40 Hz), and standard on the FT/IR-8X (40 Hz). Rapid Scan can be used for fast spectral acquisition using interval analysis.

Advanced FTIR Imaging Microscope with Linear Array Detector In recent years we have seen an explosive growth in the applications of the FTIR Imaging Microscope and the data resulting from these imaging systems. From materials research to the imaging of cancer cells and disease as well as uses as a quality control tool for polymers and pharmaceutica...

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The Start Button allows immediate start of sample measurement with a single press - this is a more convenient alternative to keyboard and mouse operation when starting data measurement.

The temperature controlled VCSEL diode laser offers high resolution spectroscopy with an exceptionally long lifetime. HeNe lasers are used for the highest resolution 0.07 cm-1 and for applications that require visible wavelengths.

The FT/IR-4X FTIR spectrometer with 45° Michelson interferometer (including permanently aligned corner-cube mirrors, diode laser, and AccuTrac™ DSP technology). A broad range beam-splitter has excellent performance in the mid-IR with DLaTGS detector and non-hygroscopic KRS-5 windows. For higher sensitivity, an MCT detector is a good addition for accessories with low light throughput, such as long path-length gas cells. The standard Ge/KBr beam-splitter can be exchanged with one of several different options to extend the wavenumber range from 15,000 cm-1 in the NIR to either 220 or 50 cm-1 in the Far-IR.

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The interferometer is manufactured as a solid cast aluminum block and is hermetically sealed. The FT/IR-4X uses a 45° Michelson interferometer, while the FT/IR-6X/8X use a 28° Michelson interferometer. A near frictionless bearing (without the need for a gas supply) supports the moving mirror which is driven electromagnetically for accurate vibration-free movement. Laser tracking of the moving mirror is made using a diode laser in the FT/IR-4X/6X and a HeNe laser in the FT/IR-8X, coupled with Accutrac™ digital signal processing. The standard solid KRS-5 windows prevent hygroscopic damage often seen with KBr or coated windows used on some products.

The FT/IR-6X and FT/IR-8X can be fitted with several vacuum options, and can be configured for full vacuum or partial with vacuum interferometer and detector compartments and with the sample chamber nitrogen purged.

Automatic recognition of the sampling accessory is made when it is fitted into the sample compartment. It can also be used to automatically load measurement parameters matched to the accessory; this ensures that data is acquired using the correct parameters.

Infrared spectroscopy is an effective technique for component analysis and interaction analysis of biological samples such as proteins, sugars and lipids. FTIR spectroscopy can be used to measure solid and liquid samples when applied to secondary structure analysis of proteins. JASCO has previously reported the study of aqueous protein solutions*1....

Corner cube mirrors automatically correct for any light path deviation, providing excellent optical stability at all times. Eliminating the need for dynamic alignment, which often lag the detrimental effects of tilt in plane mirrors.

Many optional detectors cover the range from 25,000 to 5 cm-1 and include several LN2 cooled pv/pc MCT detectors for wide, narrow and mid-band. Other detectors include silicon photodiode, InGaAs, Si bolometer, etc.

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The IRT-5000/7000 Series infrared microscopes can be easily interfaced to any FT/IR-4X, FT/IR-6X, or FT/IR-8X instrument.

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The ATR PRO Series is fully integrated, but can easily be exchanged with other sampling accessories. The external design is easy to clean with a fully rotatable (360°) anvil for full access when placing samples onto the prism.

Full field of view FFOV is sometimes used for FOV to emphasize that this is a diameter measure. Since the EP is the reference position for the FOV, this defining ray becomes the chief ray of the system.For distant objects, assuming a thin lens in air with the stop at the lens:

The FT/IR-8X is a highly configurable optical system, applicable to virtually any FTIR application, from simple Mid IR measurement to much more complex applications, such as step-scan, emission characterization etc.

The field of view FOV of an optical system is often expressed as the maximum angular size of the object as seen from the entrance pupil. The maximum image height is also used. For finite conjugate systems, the maximum object height is useful.Field of view FOV: the diameter of the object/image Half field of view HFOV: the radius of the object/image

The FT/IR-4X is a powerful mid-range, compact FTIR spectrometer, with many features that you find in a research-grade instrument, such as corner-cube mirrors, non-hygroscopic KRS-S windows and a temperature controlled DLaTGS detector.

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The highly stable interferometer with high-intensity two-stage ceramic light source offers optimum signal-to-noise performance starting at 35,000:1 and up to 55,000:1 (under standardized conditions).

All models have fully sealed and desiccated aluminum interferometer chamber. In addition, an integrated purge for the sample compartment (FT/IR-4X) and complete system (FT/IR-6X and FT/IR-8X) is included as standard.

The FT/IR-6X FTIR spectrometer includes a more advanced optical system with a 28° Michelson interferometer (also with corner-cube mirrors, diode laser, and AccuTrac™ DSP technology), for high-resolution measurement an optional  HeNe laser replaces the diode laser. The FT/IR-6X is designed for more challenging FTIR measurements such as custom sampling accessories with external detector, trace gas analysis, or emission characterization, which require higher throughput, and often require several beam-splitters and/or detectors.

The system FOV can be determined by the maximum object size, the detector size, or by the field over which the optical system exhibits good performance. For rectangular image formats, horizontal, vertical and diagonal FOVs must be specified.

The ATR PRO X is a single-reflection monolithic diamond ATR accessory with a 45° incident angle that can be placed in the sample compartment of the FT/IR-4X, FT/IR-6X, or FT/IR-8X.

FTIR-4000 and 6000 Spectrometers A high S/N measurement is often required for the FT-IR analysis of low concentrations of gas or vapor compounds. In addition, the measurement of certain gas samples can be affected by the atmospheric water vapor and carbon dioxide present in the instrument, even with nitrogen purging. It is especially difficult to a...

Spectra Manager™ 2.5 software allows users to develop predefined methods for custom sampling and analysis applications, executing with a single button press. Data Compare is standard for comparing a measured spectrum with a custom spectral library. Wiley “KnowItAll® Informatics System, JASCO Edition” with a library of 12,000 chemical and polymer spectra is standard (except LE versions) and with 3 month access to the entire spectral library database over over 260,000 IR spectra.

The FT/IR-8X FTIR spectrometer is more advanced and highly configurable, including a HeNe laser and gold-coated optics, operation is similar to the FT/IR-6X but it can also be configured for analyses that require extremely high sensitivity and resolution (down to 0.07 cm-1) or microsecond/nanosecond step-scan measurement.

The ATR PRO 4X VIEW is a single-reflection monolithic diamond ATR accessory with a 45° incident angle specifically designed for the FT/IR-4X sample compartment. The ATR PRO 4X VIEW has a camera and LCD monitor for real-time sample observation. The observed image and spectrum data are saved together in a single file.

A sequence of operations, including data processing, can be defined in a sequence in the Spectra Manager measurement application, the sequence can started by the press of the Start button for fast and comprehensive measurement.