How to Estimate the Field of View of a Microscope - how do you calculate the magnification of a microscope
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Axiom Optics is your source for high-end optical metrology systems and instruments for research and development. Contact us to discuss your needs, our experts will suggest a package of optical instrumentation that will perform to your standards in your laboratory environment.
Norland Optical Adhesive71
Accurate characterization of optical surfaces and systems is easy and convenient with optical metrology systems offered and supported by Axiom Optics. The RFLEX2, RFLEX LA, OEC and MESO optical metrology systems integrate the well known HASO Shack-Hartmann wavefront sensors and their performances directly derive from its exceptional accuracy, dynamic range and ease of use.
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CategoriesTurnkey Metrology Systems (4)Wavefront Sensors (13)AO Software Tools (2)Deformable Mirrors (5)Adaptive Optics Kits (3)All
Shack-Hartmann Wavefront sensor based optical metrology systems feature the following well-known advantages over classical fizeau or Twyman-Green interferometers :
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You can build your own optical metrology system with the customizable modular Optical Engineer Companion (OEC). This versatile system has over 800 possible combinations of HASO wavefront sensors, R-FLEX illumination units, MOD focusing modules, R-FLEX LA large aperture collimators and SMLS Single Mode Laser Systems.
Norland Optical Adhesive81
Axiom Optics is your source for high-end optical metrology systems and instruments for research and development. Contact us to discuss your needs, our experts will suggest a package of optical instrumentation that will perform to your standards in your laboratory environment.
Norland Optical Adhesive68
Shack-Hartmann Wavefront sensor based optical metrology systems feature the following well-known advantages over classical fizeau or Twyman-Green interferometers :
You can build your own optical metrology system with the customizable modular Optical Engineer Companion (OEC). This versatile system has over 800 possible combinations of HASO wavefront sensors, R-FLEX illumination units, MOD focusing modules, R-FLEX LA large aperture collimators and SMLS Single Mode Laser Systems.
Accurate characterization of optical surfaces and systems is easy and convenient with optical metrology systems offered and supported by Axiom Optics. The RFLEX2, RFLEX LA, OEC and MESO optical metrology systems integrate the well known HASO Shack-Hartmann wavefront sensors and their performances directly derive from its exceptional accuracy, dynamic range and ease of use.