LWIR

SWIR microscopes extend beyond the capabilities of standard optical microscopes. Equipped with specialized optics, light sources, and cameras, they can image samples in both the visible and shortwave infrared (SWIR) regions. This advanced imaging technology offers distinct advantages over conventional microscopes:

Swirmwir lwir

CRAIC Technologies provides tailored solutions for SWIR microscopy. These custom-designed microscopes can image across the visible to shortwave infrared spectrum and perform microscopy in transmission, reflectance, and fluorescence. Unlock new possibilities with SWIR microscopy.

For instance, silicon, which is opaque under normal light, becomes transparent in the SWIR region, allowing for the inspection of silicon-based device interiors without disassembly.